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ITC
2003
IEEE
139views Hardware» more  ITC 2003»
15 years 11 months ago
Fault Pattern Oriented Defect Diagnosis for Memories
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung...
ICIP
2008
IEEE
16 years 21 days ago
Using region semantics and visual context for scene classification
In this paper we focus on scene classification and detection of high-level concepts within multimedia documents, by introducing an intermediate contextual approach as a means of ...
Evaggelos Spyrou, Phivos Mylonas, Yannis S. Avrith...
FDL
2007
IEEE
16 years 18 days ago
Measuring the Quality of a SystemC Testbench by using Code Coverage Techniques
The system description language SystemC enables to quickly create executable specifications at adequate levbstraction for both hardware/software integration and fast design space...
Daniel Große, Hernan Peraza, Wolfgang Klinga...
ECBS
1999
IEEE
171views Hardware» more  ECBS 1999»
15 years 10 months ago
Metamodeling - Rapid Design and Evolution of Domain-Specific Modeling Environments
Model integrated computing (MIC) is gaining increased attention as an effective and efficient method for developing, maintaining, and evolving large-scale, domain-specific softwar...
Greg Nordstrom, Janos Sztipanovits, Gabor Karsai, ...
BMCBI
2008
77views more  BMCBI 2008»
15 years 6 months ago
Stochastic models for the in silico simulation of synaptic processes
Background: Research in life sciences is benefiting from a large availability of formal description techniques and analysis methodologies. These allow both the phenomena investiga...
Andrea Bracciali, Marcello Brunelli, Enrico Catald...