In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
In this paper, we describe a receding horizon scheme that satisfies a class of linear temporal logic specifications sufficient to describe a wide range of properties including saf...
Tichakorn Wongpiromsarn, Ufuk Topcu, Richard M. Mu...
Compressive sensing (CS) has been proposed for signals with sparsity in a linear transform domain. We explore a signal dependent unknown linear transform, namely the impulse respo...
Abstract. This paper is part of a general project of developing a systematic and algebraic proof theory for nonclassical logics. Generalizing our previous work on intuitionistic-su...
We combine mixed integer linear programming (MILP) and constraint programming (CP) to solve an important class of planning and scheduling problems. Tasks are allocated to faciliti...