13553 search results - page 2249 / 2711 » A Generalized Multi-View Approach |
187
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DAC
2007
ACM
16 years 7 months ago
2007
ACM
Abstract-- In nanometer-scale VLSI technologies, several interconnect issues like routing congestion and interconnect delay have become the main concerns in placement. However, all...
164
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DAC
2007
ACM
16 years 7 months ago
2007
ACM
Twisted differential line structure can effectively reduce crosstalk noise on global bus, which foresees a wide applicability. However, measured performance based on fabricated ci...
177
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DAC
2007
ACM
16 years 7 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
162
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DAC
2002
ACM
16 years 7 months ago
2002
ACM
We propose Satisfiability Checking (SAT) techniques that lead to a consistent performance improvement of up to 3x over state-ofthe-art SAT solvers like Chaff on important problem ...
179
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DAC
2002
ACM
16 years 7 months ago
2002
ACM
The next generation of computer chips will continue the trend for more complexity than their predecessors. Many of them will contain different chip technologies and are termed SoC...