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146
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CLUSTER
2007
IEEE
16 years 16 days ago
2007
IEEE
— Various mechanisms for fault-tolerance (FT) are used today in order to reduce the impact of failures on application execution. In the case of system failure, standard FT mechan...
169
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ICDAR
1997
IEEE
15 years 10 months ago
1997
IEEE
ABSTRACT: OCR is an error-prone process. It is time-consuming and expensive to manually proofread OCR results. The errors remaining in OCRed texts can cause serious problems in rea...
165
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ICSE
2008
IEEE-ACM
16 years 7 months ago
2008
IEEE-ACM
Program specifications are important in many phases of the software development process, but they are often omitted or incomplete. An important class of specifications takes the f...
166
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RECSYS
2009
ACM
15 years 11 months ago
2009
ACM
Critiquing-based recommenders do not require users to state all of their preferences upfront or rate a set of previously experienced products. Compared to other types of recommend...
183
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CLEF
2006
Springer
15 years 10 months ago
2006
Springer
This paper summarizes the work done at the State University of New York at Buffalo (UB) in the GeoCLEF 2006 track. The approach presented uses pure IR techniques (indexing of sing...