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MTDT
2003
IEEE
164views Hardware» more  MTDT 2003»
15 years 11 months ago
Applying Defect-Based Test to Embedded Memories in a COT Model
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
Robert C. Aitken
LPNMR
1997
Springer
15 years 10 months ago
Power Defaults
This paper introduces power default reasoning (PDR), a framework for nonmonotonic reasoning based on the domain-theoretic idea of modeling default rules with partial-information i...
Guo-Qiang Zhang, William C. Rounds
MOMPES
2008
IEEE
16 years 28 days ago
Architectural Concurrency Equivalence with Chaotic Models
During its lifetime, embedded systems go through multiple changes to their runtime architecture. That is, threads, processes, and processor are added or removed to/from the softwa...
Dionisio de Niz
ECOOP
2010
Springer
15 years 11 months ago
Recency Types for Analyzing Scripting Languages
Abstract. With the current surge of scripting technologies, large programs are being built with dynamically typed languages. As these programs grow in size, semantics-based tools g...
Phillip Heidegger, Peter Thiemann
ICB
2007
Springer
121views Biometrics» more  ICB 2007»
15 years 10 months ago
SVDD-Based Illumination Compensation for Face Recognition
Illumination change is one of most important and difficult problems which prevent from applying face recognition to real applications. For solving this, we propose a method to comp...
Sang-Woong Lee, Seong-Whan Lee