2694 search results - page 302 / 539 » A Description Logic of Change |
152
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APPT
2003
Springer
15 years 11 months ago
2003
Springer
This paper focuses on the problem of scheduling outages to computer systems in complex distributed environments. The interconnected nature of these systems makes scheduling global ...
161
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CAV
2003
Springer
15 years 11 months ago
2003
Springer
Run-time monitoring of temporal properties and assertions is used for testing and as a component of execution-based model checking techniques. Traditional run-time monitoring howev...
136
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ITC
1999
IEEE
15 years 11 months ago
1999
IEEE
Power consumption of digital systems may increase significantly during testing. In this paper, systems equipped with a scan-based built-in self-test like the STUMPS architecture a...
166
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DATE
1998
IEEE
15 years 11 months ago
1998
IEEE
Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (T...
163
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VTS
1997
IEEE
15 years 10 months ago
1997
IEEE
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...