24444 search results - page 4465 / 4889 » A Data Model for Data Integration |
162
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VLSID
2004
IEEE
16 years 7 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
204
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VLSID
2002
IEEE
16 years 7 months ago
2002
IEEE
Satisfiability of complex word-level formulas often arises as a problem in formal verification of hardware designs described at the register transfer level (RTL). Even though most...
167
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HPCA
2002
IEEE
16 years 7 months ago
2002
IEEE
We propose a low overhead, on-line memory monitoring scheme utilizing a set of novel hardware counters. The counters act like pressure gauges indicating the marginal gain in the n...
166
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CHI
2004
ACM
16 years 7 months ago
2004
ACM
The UK e-Science programme is relying on the evolution of the paper lab book into a pervasive data gathering lab system. To date take up of existing commercial or research lab boo...
196
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CHI
2004
ACM
16 years 7 months ago
2004
ACM
A number of global trends have a large influence on the way we use technology in our life and work, like: ? increasing connectivity and connected devices (any time, any place, any...