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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
16 years 7 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
ICSE
2001
IEEE-ACM
15 years 11 months ago
Designing Concurrent, Distributed, and Real-Time Applications with UML
Object-oriented concepts are crucial in software design because they address fundamental issues of adaptation and evolution. With the proliferation of object-oriented notations an...
Hassan Gomaa
ICIAR
2004
Springer
16 years 6 days ago
Neuro-Fuzzy Method for Automated Defect Detection in Aluminium Castings
The automated flaw detection in aluminium castings consists of two steps: a) identification of potential defects using image processing techniques, and b) classification of pote...
Sergio Hernández, Doris Saez, Domingo Mery
ISPASS
2008
IEEE
16 years 1 months ago
Pinpointing and Exploiting Opportunities for Enhancing Data Reuse
—The potential for improving the performance of data-intensive scientific programs by enhancing data reuse in cache is substantial because CPUs are significantly faster than me...
Gabriel Marin, John M. Mellor-Crummey
SIGSOFT
2010
ACM
15 years 4 months ago
Staged concurrent program analysis
Concurrent program verification is challenging because it involves exploring a large number of possible thread interleavings together with complex sequential reasoning. As a resul...
Nishant Sinha, Chao Wang