Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
In this paper, we focus on mining surprising periodic patterns in a sequence of events. In many applications, e.g., computational biology, an infrequent pattern is still considere...
Recently, there has been substantial interest in the design of crosslayer protocols for wireless networks. These protocols optimize certain performance metric(s) of interest (e.g....
Deepti Chafekar, V. S. Anil Kumar, Madhav V. Marat...
We consider experiments to measure the quality of a web search algorithm based on how much total time users take to complete assigned search tasks using that algorithm. We first ...
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
Kristen R. Walcott, Greg Humphreys, Sudhanva Gurum...