Partial Scan Selection Based on Dynamic Reachability and Observability Information

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A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-detect faults are easily detected. This is done by taking advantage of the information available when a target fault is aborted by the test generator. A partial scan selection tool, IDROPS, has been developed which selects the best and smallest set of flip-flops to scan that will result in a high fault coverage. Results indicate that high fault coverages in hard-to-test circuits can be achieved using fewer scan flip-flops than in previous methods.

Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. R

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Fewer Scan Flip-flops | Partial Scan Selection | Scan Selection Strategy | VLSI | VLSID 1998 |

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Added	05 Aug 2010
Updated	05 Aug 2010
Type	Conference
Year	1998
Where	VLSID
Authors	Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. Rudnick, Janak H. Patel

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Partial Scan Selection Based on Dynamic Reachability and Observability Information

Fewer Scan Flip-flops | Partial Scan Selection | Scan Selection Strategy | VLSI | VLSID 1998 |

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